{"title":"冲击试验下焊点断裂的瞬态模拟","authors":"Chang-Lin Yen, Y. Lai","doi":"10.1109/EPTC.2004.1396696","DOIUrl":null,"url":null,"abstract":"In this paper, transient deformation and fracturing of solder joints subjected to the impact load are investigated numerically. The three-dimensional finite element analysis applies the explicit time integration scheme and incorporates as well contact, fracturing and fragmentation mechanisms to predict the transient response and the failure mode of the solder joint subjected to an impact load.","PeriodicalId":370907,"journal":{"name":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Transient simulation of solder joint fracturing under impact test\",\"authors\":\"Chang-Lin Yen, Y. Lai\",\"doi\":\"10.1109/EPTC.2004.1396696\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, transient deformation and fracturing of solder joints subjected to the impact load are investigated numerically. The three-dimensional finite element analysis applies the explicit time integration scheme and incorporates as well contact, fracturing and fragmentation mechanisms to predict the transient response and the failure mode of the solder joint subjected to an impact load.\",\"PeriodicalId\":370907,\"journal\":{\"name\":\"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-12-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2004.1396696\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 6th Electronics Packaging Technology Conference (EPTC 2004) (IEEE Cat. No.04EX971)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2004.1396696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transient simulation of solder joint fracturing under impact test
In this paper, transient deformation and fracturing of solder joints subjected to the impact load are investigated numerically. The three-dimensional finite element analysis applies the explicit time integration scheme and incorporates as well contact, fracturing and fragmentation mechanisms to predict the transient response and the failure mode of the solder joint subjected to an impact load.