多芯片模块热管理指南

L. Liang, A. Hamzehdoost
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引用次数: 4

摘要

解决了影响MCM(多芯片模块)性能的热问题。根据SEMI-Standard测量准则,利用测试芯片收集的经验数据与利用有限元分析软件HYBRID THERMAL获得的数值进行了比较。重点放在利用PCB(印刷电路板)和陶瓷基板的低成本MCM中,热管理是最关键的。讨论的因素包括硅芯片尺寸、芯片之间的距离、整个封装的热扩散阻力、衬底材料和热通孔。所获得的结果为小型系统提供了有价值的基线指南,这些系统的关键是低成本,热管理选择有限。它们对于高性能MCM应用也很有用,例如用于高端应用的硅基衬底
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Guidelines for thermal management of multichip modules
Thermal issues affecting MCM (multichip module) performance are addressed. The empirical data collected using a test chip, in accordance with SEMI-Standard measurement guidelines, are compared with the numerical values obtained using the finite element analysis software HYBRID THERMAL. Emphasis is placed in a low-cost MCM utilizing PCB (printed circuit board) and ceramic substrates where thermal management is most critical. Among the factors discussed are Si chip size, the distance of the chips from each other, heat spreading resistance throughout the package, substrate material, and thermal vias. The results obtained provide baseline guidelines which are valuable for small systems where low cost is key and thermal management options are limited. They are also useful for high-performance MCM applications, such as silicon-based substrates for high end application.<>
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