{"title":"利用质子辐照对Kintex UltraScale现场可编程门阵列进行单事件扰动表征","authors":"D. Hiemstra, V. Kirischian, J. Brelski","doi":"10.1109/nsrec.2016.7891743","DOIUrl":null,"url":null,"abstract":"Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex UltraScale FPGA are presented. Upset rates in the space radiation environment are estimated.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation\",\"authors\":\"D. Hiemstra, V. Kirischian, J. Brelski\",\"doi\":\"10.1109/nsrec.2016.7891743\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex UltraScale FPGA are presented. Upset rates in the space radiation environment are estimated.\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"40 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/nsrec.2016.7891743\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/nsrec.2016.7891743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Single Event Upset Characterization of the Kintex UltraScale Field Programmable Gate Array Using Proton Irradiation
Proton induced SEU cross-sections of the SRAM which stores the logic configuration and certain functional blocks of the Kintex UltraScale FPGA are presented. Upset rates in the space radiation environment are estimated.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
