{"title":"用于晶圆图分类的微型交互式偏移网络(MINIONs)","authors":"Y. Zeng, Li-C. Wang, Chuanhe Jay Shan","doi":"10.1109/ITC50571.2021.00027","DOIUrl":null,"url":null,"abstract":"We present a novel approach called MINiature Interactive Offset Networks (or MINIONs). We use wafer map classification as an application example. A Minion is trained with a specially-designed one-shot learning scheme. A collection of Minions can be used to patch a master model. Experiment results are provided to explain the potential areas Minions can help and their unique benefits.","PeriodicalId":147006,"journal":{"name":"2021 IEEE International Test Conference (ITC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification\",\"authors\":\"Y. Zeng, Li-C. Wang, Chuanhe Jay Shan\",\"doi\":\"10.1109/ITC50571.2021.00027\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a novel approach called MINiature Interactive Offset Networks (or MINIONs). We use wafer map classification as an application example. A Minion is trained with a specially-designed one-shot learning scheme. A collection of Minions can be used to patch a master model. Experiment results are provided to explain the potential areas Minions can help and their unique benefits.\",\"PeriodicalId\":147006,\"journal\":{\"name\":\"2021 IEEE International Test Conference (ITC)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2021 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITC50571.2021.00027\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC50571.2021.00027","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification
We present a novel approach called MINiature Interactive Offset Networks (or MINIONs). We use wafer map classification as an application example. A Minion is trained with a specially-designed one-shot learning scheme. A collection of Minions can be used to patch a master model. Experiment results are provided to explain the potential areas Minions can help and their unique benefits.