光耦辐射退化机理及CTR测试研究

2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) Pub Date : 2019-05-01 DOI:10.1109/ICREED49760.2019.9205169

Li Xiaoliang, Xue Pengchao, L. Yanqiu, Mei Bo, Z. Hongwei, Luo Lei

{"title":"光耦辐射退化机理及CTR测试研究","authors":"Li Xiaoliang, Xue Pengchao, L. Yanqiu, Mei Bo, Z. Hongwei, Luo Lei","doi":"10.1109/ICREED49760.2019.9205169","DOIUrl":null,"url":null,"abstract":"CTR of optocoupler radiation degeneration mechanism is analyzed. The TID test is carried out for three batches devices under different bias states. It shows CTR declines with total dose increasing, and the trends agree with calculation curve. Radiation degeneration is worse under the short connection state. The analysis result of different batches device shows it has difference from each other.","PeriodicalId":124372,"journal":{"name":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Study on Radiation Degeneration Mechanism and Test for CTR of Optocoupler\",\"authors\":\"Li Xiaoliang, Xue Pengchao, L. Yanqiu, Mei Bo, Z. Hongwei, Luo Lei\",\"doi\":\"10.1109/ICREED49760.2019.9205169\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"CTR of optocoupler radiation degeneration mechanism is analyzed. The TID test is carried out for three batches devices under different bias states. It shows CTR declines with total dose increasing, and the trends agree with calculation curve. Radiation degeneration is worse under the short connection state. The analysis result of different batches device shows it has difference from each other.\",\"PeriodicalId\":124372,\"journal\":{\"name\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"volume\":\"13 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICREED49760.2019.9205169\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICREED49760.2019.9205169","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

分析了光耦合器辐射退化机理。对三批器件在不同偏置状态下进行了TID测试。CTR随总剂量的增加而下降，趋势与计算曲线一致。短连接状态下辐射退化更严重。对不同批次装置的分析结果表明，它们之间存在差异。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Study on Radiation Degeneration Mechanism and Test for CTR of Optocoupler

CTR of optocoupler radiation degeneration mechanism is analyzed. The TID test is carried out for three batches devices under different bias states. It shows CTR declines with total dose increasing, and the trends agree with calculation curve. Radiation degeneration is worse under the short connection state. The analysis result of different batches device shows it has difference from each other.

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED)

自引率

0.00%

发文量