一个混合信号测试仪解决方案:标准可追溯的交流校准模拟模块

Digest of Papers. 1992 IEEE VLSI Test Symposium Pub Date : 1992-04-07 DOI:10.1109/VTEST.1992.232729

M. F. Abate

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引用次数: 2

摘要

提出了一种以降低测试总成本为目标的混合信号测试系统架构。图中说明了测试器的体系结构、准确性和可追溯性成就，以及在减少导致测试总成本的因素中实现的好处。

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A mixed signal tester solution for: standards traceable AC calibration of analog modules

Presents a mixed signal test system architecture focused at reducing the overall cost of test. Illustrated are the tester architecture, accuracy and traceability achievements, as well as the benefits realized in the reduction of factors contributing to the overall cost of test.<>

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Digest of Papers. 1992 IEEE VLSI Test Symposium

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