多引脚功能失效隔离方法研究

Jon Ren, Gaojie Wen, Bird Fan, Winter Wang, Xiaocui Li
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引用次数: 0

摘要

随着集成电路芯片集成度的不断提高,其功能也越来越复杂。单个集成电路芯片可以具有多种功能。不同功能的输出需要不同的输出引脚,输出引脚数从几个增加到几百个。对于单个IC芯片,如果一个内部模块异常,可能会影响到多个输出引脚。大多数时候,很难找到这些引脚之间的关系。本文将采用强迫法从众多异常销中快速识别出主要失效销。该方法可以减少大量的微探针分析工作,减少故障分析时间,提高IC芯片故障分析的成功率。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Study on Multiple-pins Function Failure Isolation Method
With the integration increasing of IC chip, the function is also getting more and more complicated. A single IC chip can have many functions. Different functions of the output require different output pins, the number of output pins increases from a few to hundreds. For a single IC chip, if an internal block is abnormal, it may affect many output pins. Most of the time, it is hard to find the relationship between these pins. In this paper, forcing method would be applied to identify the major failure pin from many abnormal pins quickly. This method can reduce a lot of microprobe analysis work, reduce the failure analysis time and increase the success rate of IC chip failure analysis.
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