K. Kruckmeyer, Elisa Morozumi, R. Eddy, T. Trinh, Tom Santiago, P. Maillard
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Single Event Transient and ELDRS Characterization Test Results for LM4050QML 2.5V Precision Reference
National Semiconductor's 100 krad(Si) low dose rate qualified, 2.5V precision reference, LM4050WG2.5RLQV, was put through heavy ion testing and an enhanced low dose rate sensitivity (ELDRS) characterization. The results are presented here.
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