H. Fridhi, G. Duchamp, V. Vigneras, A. Guédon-Gracia, J. Delétage, H. Frémont
{"title":"湿度对印刷电路板电磁辐射影响的测量与模拟","authors":"H. Fridhi, G. Duchamp, V. Vigneras, A. Guédon-Gracia, J. Delétage, H. Frémont","doi":"10.1109/ESIME.2012.6191795","DOIUrl":null,"url":null,"abstract":"In this paper the effect of humidity aging on the electromagnetic radiation behavior of a printed circuit board is presented. Experimental study of the aging effect on the losses in electromagnetic radiation of the test structure was performed using a near field test bench. The samples were aged at various levels of temperature and aging times were used to measure the water absorption and the degradation of conductor's roughness surface. Numerical simulations were conducted to explore the root cause and try to validate the experimental measurements. A simulation method was established to simulate the impact of the water absorption and conductor's surface roughness.","PeriodicalId":319207,"journal":{"name":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"14 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Measurement and simulation of moisture effects on electromagnetic radiation of printed circuit boards\",\"authors\":\"H. Fridhi, G. Duchamp, V. Vigneras, A. Guédon-Gracia, J. Delétage, H. Frémont\",\"doi\":\"10.1109/ESIME.2012.6191795\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the effect of humidity aging on the electromagnetic radiation behavior of a printed circuit board is presented. Experimental study of the aging effect on the losses in electromagnetic radiation of the test structure was performed using a near field test bench. The samples were aged at various levels of temperature and aging times were used to measure the water absorption and the degradation of conductor's roughness surface. Numerical simulations were conducted to explore the root cause and try to validate the experimental measurements. A simulation method was established to simulate the impact of the water absorption and conductor's surface roughness.\",\"PeriodicalId\":319207,\"journal\":{\"name\":\"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"volume\":\"14 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2012.6191795\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 13th International Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESIME.2012.6191795","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Measurement and simulation of moisture effects on electromagnetic radiation of printed circuit boards
In this paper the effect of humidity aging on the electromagnetic radiation behavior of a printed circuit board is presented. Experimental study of the aging effect on the losses in electromagnetic radiation of the test structure was performed using a near field test bench. The samples were aged at various levels of temperature and aging times were used to measure the water absorption and the degradation of conductor's roughness surface. Numerical simulations were conducted to explore the root cause and try to validate the experimental measurements. A simulation method was established to simulate the impact of the water absorption and conductor's surface roughness.