{"title":"验证EDRAM的实用测试方法","authors":"Kent Stalnaker","doi":"10.1109/TEST.1994.527972","DOIUrl":null,"url":null,"abstract":"The Ramtron EDRAM is a 4 Mb dynamic RAM with 2 Kb static RAM cache. It is designed for 35 ns random access times, 15 ns cache cycle times with 5 ns pulse widths and includes logic functions not found on standard DRAM's. The simple solution to testing the part is a 67 to 100 MHz machine, but a more creative solution requires the use of only slightly more creative techniques. The EDRAM, while having its own unique requirements for guaranteeing proper operation, is a part that can be fully tested an standard memory test equipment capable of 30 to 5 MHz operation with an algorithmic pattern generator.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"2015 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Practical test methods for verification of the EDRAM\",\"authors\":\"Kent Stalnaker\",\"doi\":\"10.1109/TEST.1994.527972\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The Ramtron EDRAM is a 4 Mb dynamic RAM with 2 Kb static RAM cache. It is designed for 35 ns random access times, 15 ns cache cycle times with 5 ns pulse widths and includes logic functions not found on standard DRAM's. The simple solution to testing the part is a 67 to 100 MHz machine, but a more creative solution requires the use of only slightly more creative techniques. The EDRAM, while having its own unique requirements for guaranteeing proper operation, is a part that can be fully tested an standard memory test equipment capable of 30 to 5 MHz operation with an algorithmic pattern generator.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"2015 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527972\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527972","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Practical test methods for verification of the EDRAM
The Ramtron EDRAM is a 4 Mb dynamic RAM with 2 Kb static RAM cache. It is designed for 35 ns random access times, 15 ns cache cycle times with 5 ns pulse widths and includes logic functions not found on standard DRAM's. The simple solution to testing the part is a 67 to 100 MHz machine, but a more creative solution requires the use of only slightly more creative techniques. The EDRAM, while having its own unique requirements for guaranteeing proper operation, is a part that can be fully tested an standard memory test equipment capable of 30 to 5 MHz operation with an algorithmic pattern generator.