{"title":"1类QTAG监视器的开发","authors":"K. Baker, A. Bratt, A. Richardson, A. Welbers","doi":"10.1109/TEST.1994.527952","DOIUrl":null,"url":null,"abstract":"This paper describes the development by the authors of an I/sub DDQ/ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips' support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip I/sub DDQ/ monitors or ATE based measurement systems.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"59 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"Development of a class 1 QTAG monitor\",\"authors\":\"K. Baker, A. Bratt, A. Richardson, A. Welbers\",\"doi\":\"10.1109/TEST.1994.527952\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper describes the development by the authors of an I/sub DDQ/ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips' support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip I/sub DDQ/ monitors or ATE based measurement systems.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"59 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527952\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527952","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper describes the development by the authors of an I/sub DDQ/ monitor for test fixtures based on the provisional QTAG (Quality Test Action Group) standard. The monitor design project is a proof of concept study for the most demanding class 1 type current monitors defined by QTAG. In the paper the historical background to Philips' support for QTAG is outlined and why the company believes that monitors on test fixtures are currently more practical for many applications than either on-chip I/sub DDQ/ monitors or ATE based measurement systems.
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