通过x填充降低测试功率是否足够好?

2010 IEEE International Test Conference Pub Date : 2010-11-01 DOI:10.1109/TEST.2010.5699297

F. Wu, L. Dilillo, A. Bosio, P. Girard, S. Pravossoudovitch, A. Virazel, M. Tehranipoor, K. Miyase, X. Wen, N. Ahmed

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引用次数: 11

摘要

本研究探讨了为什么通过x填充技术降低测试功率对循环平均功率降低效果很好，但对瞬时峰值功率降低效果不佳的原因。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Is test power reduction through X-filling good enough?

This study investigates the reasons why test power reduction through X-filling techniques works well for cycle-average power reduction but is not so efficient concerning instantaneous peak power reduction.

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来源期刊

2010 IEEE International Test Conference

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