{"title":"体FinFET技术中ESD p方向二极管的设计与优化","authors":"You Li, M. Miao, R. Gauthier","doi":"10.23919/EOS/ESD.2018.8509757","DOIUrl":null,"url":null,"abstract":"We present an ESD P-direction STI diode fabricated in an advanced bulk FinFET technology. The impact on process and design parameters are evaluated in detail. With design optimization, the ESD P-direction STI diode achieves 46% and 16% performance improvement for It2/C and It2/Area relative to the C-direction design.","PeriodicalId":328499,"journal":{"name":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Design and Optimization of ESD P-Direction Diode in Bulk FinFET Technology\",\"authors\":\"You Li, M. Miao, R. Gauthier\",\"doi\":\"10.23919/EOS/ESD.2018.8509757\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present an ESD P-direction STI diode fabricated in an advanced bulk FinFET technology. The impact on process and design parameters are evaluated in detail. With design optimization, the ESD P-direction STI diode achieves 46% and 16% performance improvement for It2/C and It2/Area relative to the C-direction design.\",\"PeriodicalId\":328499,\"journal\":{\"name\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"volume\":\"16 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/EOS/ESD.2018.8509757\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 40th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EOS/ESD.2018.8509757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design and Optimization of ESD P-Direction Diode in Bulk FinFET Technology
We present an ESD P-direction STI diode fabricated in an advanced bulk FinFET technology. The impact on process and design parameters are evaluated in detail. With design optimization, the ESD P-direction STI diode achieves 46% and 16% performance improvement for It2/C and It2/Area relative to the C-direction design.