晶圆级压缩成型过程中封盖移位和不完全填充问题的研究

L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang
{"title":"晶圆级压缩成型过程中封盖移位和不完全填充问题的研究","authors":"L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang","doi":"10.1109/EPTC.2013.6745824","DOIUrl":null,"url":null,"abstract":"Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.","PeriodicalId":210691,"journal":{"name":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Investigation on decap shift and incomplete fill issues in the wafer level compression molding process\",\"authors\":\"L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang\",\"doi\":\"10.1109/EPTC.2013.6745824\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.\",\"PeriodicalId\":210691,\"journal\":{\"name\":\"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2013.6745824\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2013.6745824","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

耳机是解决噪音相关问题的灵丹妙药。由于距离较近的优势,decap被嵌入到封装中而不是PCB中。这些封盖通常比晶片厚度高,在晶圆级成型工艺中起着至关重要的作用。人口不合理会导致封盖移位和不完全填充问题。本文设计并优化了帽盖的合理布置。结果表明,沿晶片相邻的两侧放置晶片盖比沿晶片相反的两侧放置晶片盖能获得更好的填充效果。为了进一步减小对封盖的阻力,芯片到封盖的距离应尽可能大。这意味着狭窄的间隙会导致更高的阻力。因此,应避免狭窄的间隙,以减轻在封装和整个晶圆片的阻力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation on decap shift and incomplete fill issues in the wafer level compression molding process
Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信