L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang
{"title":"晶圆级压缩成型过程中封盖移位和不完全填充问题的研究","authors":"L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang","doi":"10.1109/EPTC.2013.6745824","DOIUrl":null,"url":null,"abstract":"Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.","PeriodicalId":210691,"journal":{"name":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Investigation on decap shift and incomplete fill issues in the wafer level compression molding process\",\"authors\":\"L. Bu, S. Ho, Sorono Dexter Velez, Boyu Zheng, S. Chong, Booyang Jung, T. Chai, Xiaowu Zhang\",\"doi\":\"10.1109/EPTC.2013.6745824\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.\",\"PeriodicalId\":210691,\"journal\":{\"name\":\"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)\",\"volume\":\"7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPTC.2013.6745824\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE 15th Electronics Packaging Technology Conference (EPTC 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2013.6745824","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Investigation on decap shift and incomplete fill issues in the wafer level compression molding process
Decaps are the panacea to cure the noise related issues. Due to the short distance advantage, decaps were embedded in the package instead of PCB. These decaps, generally having higher thickness than chips, would play a vital role in the wafer level molding process. Improper population will cause decap shift and incomplete fill issues. In the present paper, proper arrangement of decaps were designed and optimized. The results show that decaps placed along two adjacent sides rather than two opposite sides of the chip would result in better filling. In order to further reduce the drag force on decaps, chip to decap distance should be as large as possible. This implies that narrow gaps would result in higher drag force. Therefore, narrow gaps should be avoided to ease the drag force in the package as well as the whole wafer.