T. Bieler, H. Jiang, L. Lehman, T. Kirkpatrick, E. Cotts
{"title":"Sn晶粒尺寸和取向对无铅焊点热力学响应和可靠性的影响","authors":"T. Bieler, H. Jiang, L. Lehman, T. Kirkpatrick, E. Cotts","doi":"10.1109/ECTC.2006.1645849","DOIUrl":null,"url":null,"abstract":"The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle","PeriodicalId":194969,"journal":{"name":"56th Electronic Components and Technology Conference 2006","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-07-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":"{\"title\":\"Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints\",\"authors\":\"T. Bieler, H. Jiang, L. Lehman, T. Kirkpatrick, E. Cotts\",\"doi\":\"10.1109/ECTC.2006.1645849\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle\",\"PeriodicalId\":194969,\"journal\":{\"name\":\"56th Electronic Components and Technology Conference 2006\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-07-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"37\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"56th Electronic Components and Technology Conference 2006\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ECTC.2006.1645849\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"56th Electronic Components and Technology Conference 2006","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.2006.1645849","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Influence of Sn grain size and orientation on the thermomechanical response and reliability of Pb-free solder joints
The size and orientation of Sn grains in Pb-free, near eutectic SAC solder joints were examined. A clear dependence of the thermomechanical response of these solder joints on Sn grain orientation was observed. Solder balls with Sn grains of particular orientation (a-axis perpendicular to the substrate) were observed to fail before neighboring balls with different orientations. This results from the fact that the coefficient of thermal expansion of Sn along the a-axis is half the value along the c-axis; joints observed to be damaged had maximum mismatch in the coefficient of thermal expansion between solder and substrate at the joint interface, as well as tensile stress modes during the hot part of the cycle