时域和频域记忆信道表征和相关方法

E. Mintarno, S. Ji
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引用次数: 0

摘要

首先,本文讨论了一种鲁棒和高效的去嵌入技术,该技术可用于时域和频域的TDR-PNA仿真相关。采用去嵌入技术,当TDR重复性为2 mV时,TDR- pna在时域上与2 mV分辨率有很好的相关性。其次,系统分析了存储器通道tdr -仿真的相关性。时域相关是捕获阻抗不连续和串扰电平的一种有效而直接的方法。最后,对平台存储器互连开发提出了一些设计、建模和测量指南。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Time and frequency domain memory channel characterization and correlation methodology
First, this paper discusses a robust and efficient de- embedding technique that can be used for TDR-PNA- simulation correlation in time or frequency domain. Employing the de-embedding technique, TDR-PNA was shown to correlate very well with 2 mV resolution in time- domain, when TDR repeatability is 2 mV. Next, a systematic analysis of memory channel TDR-simulation correlation was detailed. Time domain correlation served as an efficient and straightforward way of capturing impedance discontinuities and crosstalk level. Finally, some design, modeling, and measurement guidelines for platform memory interconnect development were recommended.
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