{"title":"FIR数字滤波器的功能BIST方法","authors":"C. Counil, G. Cambon","doi":"10.1109/VTEST.1992.232730","DOIUrl":null,"url":null,"abstract":"Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<<ETX>>","PeriodicalId":434977,"journal":{"name":"Digest of Papers. 1992 IEEE VLSI Test Symposium","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"A functional BIST approach for FIR digital filters\",\"authors\":\"C. Counil, G. Cambon\",\"doi\":\"10.1109/VTEST.1992.232730\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<<ETX>>\",\"PeriodicalId\":434977,\"journal\":{\"name\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Digest of Papers. 1992 IEEE VLSI Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VTEST.1992.232730\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers. 1992 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1992.232730","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A functional BIST approach for FIR digital filters
Presents a functional level built-in self-test of digital filters. This BIST technique is based on predetermined patterns which are not dependent on the filter implementation. Many examples show that stuck-at fault coverage is about 98%.<>
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