{"title":"平衡测试的结构化和临时设计:powerpc603微处理器的测试","authors":"C. Hunter, E. K. Vida-Torku, J. LeBlanc","doi":"10.1109/TEST.1994.527938","DOIUrl":null,"url":null,"abstract":"The PowerPC 603 microprocessor is a high performance, low power, and low cost RISC microprocessor which was designed at the Somerset Design Center by a team of Motorola, IBM and Apple engineers. The testability and manufacturability features implemented in the PowerPC 603 microprocessor are presented, as well as the issues involved in reconciling a common test plan for two fabrication facilities with differing expectations.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"76 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"33","resultStr":"{\"title\":\"Balancing structured and ad-hoc design for test: testing of the PowerPC 603 microprocessor\",\"authors\":\"C. Hunter, E. K. Vida-Torku, J. LeBlanc\",\"doi\":\"10.1109/TEST.1994.527938\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The PowerPC 603 microprocessor is a high performance, low power, and low cost RISC microprocessor which was designed at the Somerset Design Center by a team of Motorola, IBM and Apple engineers. The testability and manufacturability features implemented in the PowerPC 603 microprocessor are presented, as well as the issues involved in reconciling a common test plan for two fabrication facilities with differing expectations.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"76 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"33\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527938\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527938","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Balancing structured and ad-hoc design for test: testing of the PowerPC 603 microprocessor
The PowerPC 603 microprocessor is a high performance, low power, and low cost RISC microprocessor which was designed at the Somerset Design Center by a team of Motorola, IBM and Apple engineers. The testability and manufacturability features implemented in the PowerPC 603 microprocessor are presented, as well as the issues involved in reconciling a common test plan for two fabrication facilities with differing expectations.