低线性依赖和等分布伪随机模式的设计

Proceedings of IEEE 3rd Asian Test Symposium (ATS) Pub Date : 1994-11-15 DOI:10.1109/ATS.1994.367219

S. Matsufuji, S. Tadaki, T. Yamanaka

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引用次数: 0

摘要

一些相移m序列给出的等分布伪随机图常用于产生仿真中使用的随机数和VLSI测试中的测试图。低线性依赖性是随机模式和等分布的重要特性之一。本文讨论了具有等分布和低线性依赖性的伪随机模式。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Design of pseudo-random patterns with low linear dependence and equi-distribution

Pseudo-random patterns with equi-distribution given by some phase-shifted M-sequences are often used to produce random numbers used in simulations and test patterns in VLSI tests. Low linear dependency is one of the desirable and important properties of random patterns as well as equi-distribution. This paper discusses pseudo-random patterns with equi-distribution and low linear dependence.<>

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Proceedings of IEEE 3rd Asian Test Symposium (ATS)

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