{"title":"表面贴装器件板的复合光电测试-一家制造商的经验","authors":"F. J. Langley, Ronald R. Boatright, L. Crosby","doi":"10.1109/TEST.1989.82356","DOIUrl":null,"url":null,"abstract":"The use of surface-mount devices (SMDs) in the US manufacture of high-quality switchboards presented the need to reduce cost, while maintaining traditional quality and reliability, and without decreasing throughput or adding process steps. Further, the complexity of the display panels demanded a completely automatic test solution without the operator in the loop. The authors describe the use of automatic optical inspection in conjunction with electrical testing for a medium-volume manufacturing situation. The effectiveness of this test solution in meeting the needs of a major change in device technology is quantified from measurement accuracy and consistency viewpoints. Increased production efficiency as compared with previous tests strategies is indicated.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"74 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":"{\"title\":\"Composite electro-optical testing of surface-mount device boards-one manufacturer's experience\",\"authors\":\"F. J. Langley, Ronald R. Boatright, L. Crosby\",\"doi\":\"10.1109/TEST.1989.82356\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The use of surface-mount devices (SMDs) in the US manufacture of high-quality switchboards presented the need to reduce cost, while maintaining traditional quality and reliability, and without decreasing throughput or adding process steps. Further, the complexity of the display panels demanded a completely automatic test solution without the operator in the loop. The authors describe the use of automatic optical inspection in conjunction with electrical testing for a medium-volume manufacturing situation. The effectiveness of this test solution in meeting the needs of a major change in device technology is quantified from measurement accuracy and consistency viewpoints. Increased production efficiency as compared with previous tests strategies is indicated.<<ETX>>\",\"PeriodicalId\":264111,\"journal\":{\"name\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"volume\":\"74 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1989.82356\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82356","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Composite electro-optical testing of surface-mount device boards-one manufacturer's experience
The use of surface-mount devices (SMDs) in the US manufacture of high-quality switchboards presented the need to reduce cost, while maintaining traditional quality and reliability, and without decreasing throughput or adding process steps. Further, the complexity of the display panels demanded a completely automatic test solution without the operator in the loop. The authors describe the use of automatic optical inspection in conjunction with electrical testing for a medium-volume manufacturing situation. The effectiveness of this test solution in meeting the needs of a major change in device technology is quantified from measurement accuracy and consistency viewpoints. Increased production efficiency as compared with previous tests strategies is indicated.<>