集成测试设施(ITF)-自动化测试，以支持英特尔的制造输出

1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023) Pub Date : 1900-01-01 DOI:10.1109/ISSM.1997.664526

J. Bisgrove, R. Dayao, B. Houser, T. Jones, J. Mayes, M. McGinnis, M. Schmidt, G. Skyles, B. K. Tan

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引用次数: 4

摘要

为了应对日益增加的自动化和潜在的停机时间的挑战，当前的虚拟工厂联合自动化经理(JAM)与负责自动化系统的中央工程小组组件自动化系统(CAS)合作，创建了一个集成测试设施(ITF)。ITF的任务是在产品发布之前对自动化套件进行批量集成测试，并确保自动化套件不会影响工厂生产。ITF是一个完整的工厂自动化系统，运行模拟生产晶圆。ITF成立于1996年1月，测试集成到完整工厂制造自动化系统中的新自动化产品变更，并证明它们可以大批量运行。与CAS自动化过程集成，ITF是交付高质量软件过程的关键部分。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Integrated test facility (ITF)-automation testing to support Intel's manufacturing output

To meet the challenges of increasing automation and the potential for downtime, the current Virtual Factory Joint Automation Managers (JAM) worked with Components Automation Systems (CAS), the central engineering group responsible for the automation system, to create an Integrated Test Facility (ITF). ITF's mission is to conduct volume integrated testing of the automation suite prior to production release and to ensure that the automation suite does not hinge factory ramp. The ITF is a complete factory automation system running simulated production wafers. Established in January 1996, the ITF tests new automation product changes integrated into a complete factory manufacturing automation system and certifies that they can run in high volume. Integrated with CAS automation processes, the ITF is a key part of a process that delivers quality software.

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来源期刊

1997 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat. No.97CH36023)

CiteScore

0.80

自引率

0.00%

发文量