无铅钎料Sn96.5Ag3.5的温度和应变速率行为研究

F. Zhu, H. Zhang, R. Guan, S. Liu, Y.B. Yang
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引用次数: 5

摘要

近年来,鉴于铅基焊料合金的固有毒性,许多国家将开始禁止在微电子封装工艺中使用铅基焊料。欧盟废弃电子电气设备(WEEE)指令规定,2006年1月以后将禁止在消费电子产品中使用铅。因此,开发替代含铅焊料的无铅焊料已成为学术界和微电子封装行业面临的重要课题。由于形成了细小的Ag3Sn金属间化合物沉淀,Sn-Ag二元无铅钎料具有良好的力学性能(延展性、抗蠕变性和耐热性),是取代含铅钎料用于微电子封装和互连的理想钎料。然而,由于Sn-Ag焊料合金用于微电子互连工艺的历史不长,许多力学性能尚未明确。焊接合金作为微电子封装工艺中的互连材料,其力学性能是影响封装质量、决定焊点断裂和热疲劳行为的重要环节。近年来,随着电路板元件密度的不断提高,微电子封装尺寸和凸点尺寸不断减小。因此,在封装过程中对无铅焊料的机械特性要求将更加严格。因此,对锡银二元钎料力学性能的研究是微电子工业和学术界必不可少的工作。微电子元件和器件在工作过程中,封装和互连材料会受到热机械应力和应变的影响,从而影响微电子元件的可靠性和寿命。因此,本研究重点研究了无铅钎料合金Sn96.5Ag3.5在25℃~ 125℃不同温度、10-5 S-1 ~ 10-1 S-1应变速率下的热力学性能。利用扫描电子显微镜(SEM)对Sn96.5Ag3.5无铅焊料的断口形貌和显微组织进行了分析。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Investigation of Temperature and Strain Rate Behavior of Lead-free Solder Sn96.5Ag3.5
In the late years, many countries will begin to prohibit using the lead-based solders in microelectronic packaging processes in view of inherent toxicity of lead-based solder alloys. The waste electrical and electronic equipment (WEEE) directive by EU has claimed that the use of Pb in consumer electronics will be banned after January 2006. Therefore, the development of lead-free solders replacing Pb-containing solders has been a crucial task for academe and microelectronic packaging industry. Due to the formation of fine Ag3Sn inter-metallic compound precipitates, Sn-Ag binary lead-free solders have some good mechanical properties (ductility, creep resistance and thermal resistance), and they were defined promising candidates substituting Pb-containing solders in microelectronic packaging and interconnecting. However, many mechanical properties of Sn-Ag alloys have not been clarified because Sn-Ag solder alloys used in microelectronic interconnecting process have not a long history. As the interconnecting materials in microelectronic packaging processes, mechanical properties of soldering alloys are important parts to impact the packaging quality, and determine the fracture and thermal fatigue behaviors of solder joint. Recently the trend of higher circuit board component densities results in the decrease of microelectronic packaging dimensions and the solder bump sizes. Therefore, the requirements for mechanical characteristics of lead-free solders will be more rigorous in packaging process. Thus, the research work about the mechanical properties of Sn-Ag binary solders is essential to microelectronic industry and academe. During microelectronic components and devices operating, the packaging and interconnecting materials would be subjected to the thermal-mechanical stress and strain which could affect the reliability and life of microelectronic components. Thus, in this study, it was focused on researching thermal-mechanical properties of the lead-free solder alloy Sn96.5Ag3.5 at different temperature ranging from 25 degC to 125 degC and various strain rate ranging from 10-5 S-1 to 10-1 S-1. Morphology of rupture surface and microstructure of this lead-free solder Sn96.5Ag3.5 were also analyzed by using the scanning electron microscope (SEM)
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