{"title":"HR PD-SOI mosfet固有输出等效电路的改进射频建模","authors":"Changjo Lee, Seonghearn Lee","doi":"10.1109/IMFEDK.2018.8581942","DOIUrl":null,"url":null,"abstract":"The low-frequency effect showing abrupt change of intrinsic output capacitance and conductance for high resistivity(HR) PD-SOI MOSFETs is well modeled using an improved RF output equivalent circuit with a series RC network. The output circuit parameters are accurately extracted by fitting frequency-dependent output capacitance and conductance equations to each measured data. The good agreements between measured and modeled Y 22 -parameter are obtained from 50 MHz to 10GHz.","PeriodicalId":434417,"journal":{"name":"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","volume":"150 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Improved RF Modeling of Intrinsic Output Equivalent Circuit for HR PD-SOI MOSFETs\",\"authors\":\"Changjo Lee, Seonghearn Lee\",\"doi\":\"10.1109/IMFEDK.2018.8581942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The low-frequency effect showing abrupt change of intrinsic output capacitance and conductance for high resistivity(HR) PD-SOI MOSFETs is well modeled using an improved RF output equivalent circuit with a series RC network. The output circuit parameters are accurately extracted by fitting frequency-dependent output capacitance and conductance equations to each measured data. The good agreements between measured and modeled Y 22 -parameter are obtained from 50 MHz to 10GHz.\",\"PeriodicalId\":434417,\"journal\":{\"name\":\"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)\",\"volume\":\"150 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMFEDK.2018.8581942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMFEDK.2018.8581942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Improved RF Modeling of Intrinsic Output Equivalent Circuit for HR PD-SOI MOSFETs
The low-frequency effect showing abrupt change of intrinsic output capacitance and conductance for high resistivity(HR) PD-SOI MOSFETs is well modeled using an improved RF output equivalent circuit with a series RC network. The output circuit parameters are accurately extracted by fitting frequency-dependent output capacitance and conductance equations to each measured data. The good agreements between measured and modeled Y 22 -parameter are obtained from 50 MHz to 10GHz.