{"title":"VLSI与移动性","authors":"B. Thuillier","doi":"10.1109/vdat.2006.258108","DOIUrl":null,"url":null,"abstract":"Summary form only given. Mobile phone baseband, power management unit and RF integration is an area of expanding interest within the semiconductor industry as it enables highly integrated solution and hence has the capability to address mobile phone fragmentation in ultra low cost, mid and high end areas. This paper presents the progress, limits and challenges of integration in relation with mobility. Some suggestions regarding potential directions are included. VLSI design, automation and testing progress may help to further improve new features integration flexibility, application speed and power consumption optimization","PeriodicalId":356198,"journal":{"name":"2006 International Symposium on VLSI Design, Automation and Test","volume":"66 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"VLSI & Mobility\",\"authors\":\"B. Thuillier\",\"doi\":\"10.1109/vdat.2006.258108\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary form only given. Mobile phone baseband, power management unit and RF integration is an area of expanding interest within the semiconductor industry as it enables highly integrated solution and hence has the capability to address mobile phone fragmentation in ultra low cost, mid and high end areas. This paper presents the progress, limits and challenges of integration in relation with mobility. Some suggestions regarding potential directions are included. VLSI design, automation and testing progress may help to further improve new features integration flexibility, application speed and power consumption optimization\",\"PeriodicalId\":356198,\"journal\":{\"name\":\"2006 International Symposium on VLSI Design, Automation and Test\",\"volume\":\"66 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 International Symposium on VLSI Design, Automation and Test\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/vdat.2006.258108\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 International Symposium on VLSI Design, Automation and Test","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/vdat.2006.258108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Summary form only given. Mobile phone baseband, power management unit and RF integration is an area of expanding interest within the semiconductor industry as it enables highly integrated solution and hence has the capability to address mobile phone fragmentation in ultra low cost, mid and high end areas. This paper presents the progress, limits and challenges of integration in relation with mobility. Some suggestions regarding potential directions are included. VLSI design, automation and testing progress may help to further improve new features integration flexibility, application speed and power consumption optimization
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