{"title":"MSSL的COTS组件辐射测试活动和结果","authors":"Daohua Hu","doi":"10.1109/NSREC.2016.7891708","DOIUrl":null,"url":null,"abstract":"this paper reports a full radiation test results for two popular commercial off the shelf (COTS) devices ADC128S102 and DAC121S101, targeted for use in MSSL's VIS instrument on ESA's EUCLID mission. The tests include total ionization dose (TID) and single event effect (SEE). The TID test shows both devices have passed 30krad test limit. Single event latch-up (SEL) has been observed at both devices at LET of 60 MeV.cm2.mg-1 or below.","PeriodicalId":135325,"journal":{"name":"2016 IEEE Radiation Effects Data Workshop (REDW)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"COTS Components Radiation Test Activity and Results at MSSL\",\"authors\":\"Daohua Hu\",\"doi\":\"10.1109/NSREC.2016.7891708\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"this paper reports a full radiation test results for two popular commercial off the shelf (COTS) devices ADC128S102 and DAC121S101, targeted for use in MSSL's VIS instrument on ESA's EUCLID mission. The tests include total ionization dose (TID) and single event effect (SEE). The TID test shows both devices have passed 30krad test limit. Single event latch-up (SEL) has been observed at both devices at LET of 60 MeV.cm2.mg-1 or below.\",\"PeriodicalId\":135325,\"journal\":{\"name\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE Radiation Effects Data Workshop (REDW)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NSREC.2016.7891708\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Radiation Effects Data Workshop (REDW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NSREC.2016.7891708","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
COTS Components Radiation Test Activity and Results at MSSL
this paper reports a full radiation test results for two popular commercial off the shelf (COTS) devices ADC128S102 and DAC121S101, targeted for use in MSSL's VIS instrument on ESA's EUCLID mission. The tests include total ionization dose (TID) and single event effect (SEE). The TID test shows both devices have passed 30krad test limit. Single event latch-up (SEL) has been observed at both devices at LET of 60 MeV.cm2.mg-1 or below.