{"title":"数字和混合信号电路测试签名分析仪的统一设计方法","authors":"V. Geurkov, L. Kirischian","doi":"10.1109/ITC44778.2020.9325274","DOIUrl":null,"url":null,"abstract":"We present a simple unified approach to designing algebraic/arithmetic signature analyzers. The design technique is valid for an arbitrary number system. The proposed devices have low hardware complexity and low aliasing rate. The technique can also be used in error-control coding and cryptography.","PeriodicalId":251504,"journal":{"name":"2020 IEEE International Test Conference (ITC)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing\",\"authors\":\"V. Geurkov, L. Kirischian\",\"doi\":\"10.1109/ITC44778.2020.9325274\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present a simple unified approach to designing algebraic/arithmetic signature analyzers. The design technique is valid for an arbitrary number system. The proposed devices have low hardware complexity and low aliasing rate. The technique can also be used in error-control coding and cryptography.\",\"PeriodicalId\":251504,\"journal\":{\"name\":\"2020 IEEE International Test Conference (ITC)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2020 IEEE International Test Conference (ITC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ITC44778.2020.9325274\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 IEEE International Test Conference (ITC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ITC44778.2020.9325274","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Unified Method of Designing Signature Analyzers for Digital and Mixed-Signal Circuits Testing
We present a simple unified approach to designing algebraic/arithmetic signature analyzers. The design technique is valid for an arbitrary number system. The proposed devices have low hardware complexity and low aliasing rate. The technique can also be used in error-control coding and cryptography.