{"title":"挠曲盖-焊膏碰撞","authors":"P. Elenius","doi":"10.1109/ISAPM.1997.581271","DOIUrl":null,"url":null,"abstract":"Soldered flip chips require the formation of a solder bump on the semiconductor device. Traditional solder deposition methods of evaporation and plating have limitations both from a cost structure as well as in capability to meet product requirements. Presented in this paper are the capabilities and reliability results of the FOC (Flex on Cap) solder paste bumping process developed by Delco Electronics and practised by flip chip technologies. This paper describes the fine pitch capabilities, solder alloys, bump height uniformity, alloy control and reliability data for the FOC process. The solder paste process permits cost effective bumping of low alpha solders either W/Pb or Pb free alloys. The importance of the UBM (Under Bump Metalization) for reliable eutectic Pb/Sn and other high Sn content solders that are important for the DCA (Direct Chip Attach) market is shown. The system level cost savings of having all the necessary solder present on the IC, eliminating the deposition of solder on the board, are given.","PeriodicalId":248825,"journal":{"name":"Proceedings 3rd International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-03-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Flex on cap-solder paste bumping\",\"authors\":\"P. Elenius\",\"doi\":\"10.1109/ISAPM.1997.581271\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Soldered flip chips require the formation of a solder bump on the semiconductor device. Traditional solder deposition methods of evaporation and plating have limitations both from a cost structure as well as in capability to meet product requirements. Presented in this paper are the capabilities and reliability results of the FOC (Flex on Cap) solder paste bumping process developed by Delco Electronics and practised by flip chip technologies. This paper describes the fine pitch capabilities, solder alloys, bump height uniformity, alloy control and reliability data for the FOC process. The solder paste process permits cost effective bumping of low alpha solders either W/Pb or Pb free alloys. The importance of the UBM (Under Bump Metalization) for reliable eutectic Pb/Sn and other high Sn content solders that are important for the DCA (Direct Chip Attach) market is shown. The system level cost savings of having all the necessary solder present on the IC, eliminating the deposition of solder on the board, are given.\",\"PeriodicalId\":248825,\"journal\":{\"name\":\"Proceedings 3rd International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-03-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 3rd International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISAPM.1997.581271\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 3rd International Symposium on Advanced Packaging Materials Processes, Properties and Interfaces","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISAPM.1997.581271","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 9
摘要
焊接倒装芯片需要在半导体器件上形成一个焊料凸起。传统的蒸发和电镀焊锡沉积方法在成本结构和满足产品要求的能力方面都有局限性。本文介绍了Delco Electronics开发的FOC (Flex on Cap)焊膏碰撞工艺的性能和可靠性结果,并通过倒装芯片技术进行了实践。本文介绍了FOC工艺的细间距性能、焊料合金、凹凸高度均匀性、合金控制和可靠性数据。锡膏工艺允许低α焊料(W/Pb或无Pb合金)的低成本碰撞。UBM (Under Bump Metalization)对于可靠的共晶Pb/Sn和其他高锡含量焊料的重要性,对于DCA(直接芯片连接)市场非常重要。系统级的成本节约有所有必要的焊料存在于集成电路,消除焊料沉积在电路板上,给出。
Soldered flip chips require the formation of a solder bump on the semiconductor device. Traditional solder deposition methods of evaporation and plating have limitations both from a cost structure as well as in capability to meet product requirements. Presented in this paper are the capabilities and reliability results of the FOC (Flex on Cap) solder paste bumping process developed by Delco Electronics and practised by flip chip technologies. This paper describes the fine pitch capabilities, solder alloys, bump height uniformity, alloy control and reliability data for the FOC process. The solder paste process permits cost effective bumping of low alpha solders either W/Pb or Pb free alloys. The importance of the UBM (Under Bump Metalization) for reliable eutectic Pb/Sn and other high Sn content solders that are important for the DCA (Direct Chip Attach) market is shown. The system level cost savings of having all the necessary solder present on the IC, eliminating the deposition of solder on the board, are given.