集成电路特性匹配,优化系统性能

Kenneth R. Stuchlik
{"title":"集成电路特性匹配,优化系统性能","authors":"Kenneth R. Stuchlik","doi":"10.1109/TEST.1989.82313","DOIUrl":null,"url":null,"abstract":"The author addresses integrated-circuit performance characteristic-matching considerations for which multiple suppliers or technologies are required. It is suggested that, in order to ensure robust designs in high-performance systems, the variability between the required devices and suppliers should be minimized. The variability can be minimized through the evaluation of the critical performance characteristics, both specified and nonspecified, of all desired suppliers and technologies. The selection of suppliers or technologies may then be limited to those which are the most compatible or to a source with the most desirable characteristics. As performance requirements increase, the current specification methods and the parameters specified are becoming less and less adequate to ensure consistency in the design and manufacture of modern high-performance systems. A more desirable method may be to specify target means and distributions versus minimum/maximum limits. In addition, the requirement to specify performance-related parameters. Such as speed performance offsets or dynamic high- and/or low-level input voltage levels, should also be pursued. As an example, an outline of a basic study of the 74FXXX family of devices is presented.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"90 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"IC characteristic matching for optimal system performance\",\"authors\":\"Kenneth R. Stuchlik\",\"doi\":\"10.1109/TEST.1989.82313\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The author addresses integrated-circuit performance characteristic-matching considerations for which multiple suppliers or technologies are required. It is suggested that, in order to ensure robust designs in high-performance systems, the variability between the required devices and suppliers should be minimized. The variability can be minimized through the evaluation of the critical performance characteristics, both specified and nonspecified, of all desired suppliers and technologies. The selection of suppliers or technologies may then be limited to those which are the most compatible or to a source with the most desirable characteristics. As performance requirements increase, the current specification methods and the parameters specified are becoming less and less adequate to ensure consistency in the design and manufacture of modern high-performance systems. A more desirable method may be to specify target means and distributions versus minimum/maximum limits. In addition, the requirement to specify performance-related parameters. Such as speed performance offsets or dynamic high- and/or low-level input voltage levels, should also be pursued. As an example, an outline of a basic study of the 74FXXX family of devices is presented.<<ETX>>\",\"PeriodicalId\":264111,\"journal\":{\"name\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"volume\":\"90 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1989.82313\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82313","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

作者讨论了需要多个供应商或技术的集成电路性能特征匹配考虑因素。建议,为了确保高性能系统的稳健设计,应尽量减少所需设备和供应商之间的可变性。通过对所有期望的供应商和技术的关键性能特征(包括指定的和非指定的)的评价,可变性可以最小化。因此,供应商或技术的选择可能仅限于那些最兼容的供应商或具有最理想特性的来源。随着性能要求的提高,现有的规范方法和规定的参数越来越不足以保证现代高性能系统设计和制造的一致性。更理想的方法可能是指定目标均值和分布,而不是最小/最大限制。此外,还需要指定与性能相关的参数。如速度性能偏移或动态高和/或低电平输入电压水平,也应追求。本文以74FXXX系列器件为例,概述了器件的基本研究。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
IC characteristic matching for optimal system performance
The author addresses integrated-circuit performance characteristic-matching considerations for which multiple suppliers or technologies are required. It is suggested that, in order to ensure robust designs in high-performance systems, the variability between the required devices and suppliers should be minimized. The variability can be minimized through the evaluation of the critical performance characteristics, both specified and nonspecified, of all desired suppliers and technologies. The selection of suppliers or technologies may then be limited to those which are the most compatible or to a source with the most desirable characteristics. As performance requirements increase, the current specification methods and the parameters specified are becoming less and less adequate to ensure consistency in the design and manufacture of modern high-performance systems. A more desirable method may be to specify target means and distributions versus minimum/maximum limits. In addition, the requirement to specify performance-related parameters. Such as speed performance offsets or dynamic high- and/or low-level input voltage levels, should also be pursued. As an example, an outline of a basic study of the 74FXXX family of devices is presented.<>
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