用于板级测试的嵌入式合成仪器

2012 17th IEEE European Test Symposium (ETS) Pub Date : 2012-05-28 DOI:10.1109/ETS.2012.6233044

A. Jutman, S. Devadze, I. Aleksejev, T. Wenzel

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引用次数: 5

摘要

本文的主要目的是完善我们之前[1]提出的基于fpga的合成仪器概念(参见第1节)的好处，并提供一些基于实际工业设计的新实验数据，以显示我们方法的效率(参见第2节)。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Embedded synthetic instruments for Board-Level testing

The main purpose of this paper is to refine the benefits of the FPGA-based synthetic instrumentation concept (see Section 1) proposed by us earlier [1] as well as to provide some new experimental data based on real industrial designs to show the efficiency of our methodology (see Section 2).

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2012 17th IEEE European Test Symposium (ETS)

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