{"title":"微电子学课程综合测试的整合","authors":"K. Prasad, A. Goel","doi":"10.1109/ATW.1994.747839","DOIUrl":null,"url":null,"abstract":"This paper presents the issues pertinent to Microelectronics/VLSI Education in general, and comprehensive Testing, in particular. Integrated Circuit design employing modem testing methodologies plays a central role in microelectronics and encompasses multiple levels of abstraction: physics, chemistry, logic design, computer architecture and so forth. The Microelectronics/VLSI Educator is challenged to transcend these disparate disciplines and transform an idea into the detailed specifications for a manufactured chip(system). The system must be decomposed into subsystem, subsystem into modules, modules into components, along with exhaustive testing at each stage.","PeriodicalId":217615,"journal":{"name":"The Third Annual Atlantic Test Workshop","volume":"127 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integration Of Comprehensive Testing In Microelectronics Curriculum\",\"authors\":\"K. Prasad, A. Goel\",\"doi\":\"10.1109/ATW.1994.747839\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the issues pertinent to Microelectronics/VLSI Education in general, and comprehensive Testing, in particular. Integrated Circuit design employing modem testing methodologies plays a central role in microelectronics and encompasses multiple levels of abstraction: physics, chemistry, logic design, computer architecture and so forth. The Microelectronics/VLSI Educator is challenged to transcend these disparate disciplines and transform an idea into the detailed specifications for a manufactured chip(system). The system must be decomposed into subsystem, subsystem into modules, modules into components, along with exhaustive testing at each stage.\",\"PeriodicalId\":217615,\"journal\":{\"name\":\"The Third Annual Atlantic Test Workshop\",\"volume\":\"127 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-08-06\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"The Third Annual Atlantic Test Workshop\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATW.1994.747839\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"The Third Annual Atlantic Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATW.1994.747839","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Integration Of Comprehensive Testing In Microelectronics Curriculum
This paper presents the issues pertinent to Microelectronics/VLSI Education in general, and comprehensive Testing, in particular. Integrated Circuit design employing modem testing methodologies plays a central role in microelectronics and encompasses multiple levels of abstraction: physics, chemistry, logic design, computer architecture and so forth. The Microelectronics/VLSI Educator is challenged to transcend these disparate disciplines and transform an idea into the detailed specifications for a manufactured chip(system). The system must be decomposed into subsystem, subsystem into modules, modules into components, along with exhaustive testing at each stage.