微电子学课程综合测试的整合

K. Prasad, A. Goel
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引用次数: 0

摘要

本文介绍了与微电子/超大规模集成电路教育相关的问题,特别是综合测试。采用现代测试方法的集成电路设计在微电子学中起着核心作用,它包含了多个抽象层次:物理、化学、逻辑设计、计算机体系结构等等。微电子/VLSI教育者面临的挑战是超越这些不同的学科,并将想法转化为制造芯片(系统)的详细规格。系统必须分解为子系统,子系统分解为模块,模块分解为组件,并在每个阶段进行详尽的测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Integration Of Comprehensive Testing In Microelectronics Curriculum
This paper presents the issues pertinent to Microelectronics/VLSI Education in general, and comprehensive Testing, in particular. Integrated Circuit design employing modem testing methodologies plays a central role in microelectronics and encompasses multiple levels of abstraction: physics, chemistry, logic design, computer architecture and so forth. The Microelectronics/VLSI Educator is challenged to transcend these disparate disciplines and transform an idea into the detailed specifications for a manufactured chip(system). The system must be decomposed into subsystem, subsystem into modules, modules into components, along with exhaustive testing at each stage.
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