IJTAG compatible analogue embedded instruments for MPSoC life-time prediction

Decreasing reliability of nanometer CMOS technologies with each technology generation is a bottleneck for development of dependable Cyber Physical Systems. This paper presents two analogue health monitors, namely IDDT and temperature along with their integration to the IJTAG network for MPSoC life-time prediction. The monitors are integrated as embedded instruments in a MPSoC. A technique for dynamic synthesis of the analogue front-end for the IDDT instrument and an architecture for integrating analogue embedded instruments into an IJTAG network is introduced in this paper. The embedded instruments have been designed in TSMC 40nm CMOS technology.