{"title":"基于软件的处理器自检可测试性设计","authors":"Masato Nakazato, S. Ohtake, M. Inoue, H. Fujiwara","doi":"10.1109/ATS.2006.38","DOIUrl":null,"url":null,"abstract":"In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead","PeriodicalId":242530,"journal":{"name":"2006 15th Asian Test Symposium","volume":"123 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":"{\"title\":\"Design for Testability of Software-Based Self-Test for Processors\",\"authors\":\"Masato Nakazato, S. Ohtake, M. Inoue, H. Fujiwara\",\"doi\":\"10.1109/ATS.2006.38\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead\",\"PeriodicalId\":242530,\"journal\":{\"name\":\"2006 15th Asian Test Symposium\",\"volume\":\"123 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-11-20\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"16\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2006 15th Asian Test Symposium\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2006.38\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 15th Asian Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2006.38","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Design for Testability of Software-Based Self-Test for Processors
In this paper, the authors propose a design for testability method for test programs of software-based self-test using test program templates. Software-based self-test using templates has a problem of error masking where some faults detected in a test generation for a module are not detected by the test program synthesized from the test. The proposed method achieves 100% template level fault efficiency in a sense that the proposed method completely resolves the problem of error masking. Moreover, the proposed method adds only observation points to the original design, and it enables at-speed testing and does not induce delay overhead