{"title":"一个电信线路接口测试系统架构","authors":"J. LaMay, D. Caldwell","doi":"10.1109/TEST.1989.82297","DOIUrl":null,"url":null,"abstract":"The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices.<<ETX>>","PeriodicalId":264111,"journal":{"name":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1989-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A telecommunications line interface test system architecture\",\"authors\":\"J. LaMay, D. Caldwell\",\"doi\":\"10.1109/TEST.1989.82297\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices.<<ETX>>\",\"PeriodicalId\":264111,\"journal\":{\"name\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-08-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 'Meeting the Tests of Time'., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1989.82297\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 'Meeting the Tests of Time'., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1989.82297","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A telecommunications line interface test system architecture
The authors present new test techniques which have been used to develop a high-quality, cost-efficient test module suitable for high-volume testing of T1/PCM-39 line interface devices. This test module is capable of fully testing the key parameters of sophisticated line interface driver/receivers (jitter tolerance, jitter attenuation, and pulse-shape template conformance). Using this module, a 75% reduction in test time was achieved. The test system is being used for production testing of ISDN (integrated services digital network) primary-rate line interface devices.<>
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