{"title":"一种估计形式化验证问题难度的技术","authors":"Indradeep Ghosh, M. Prasad","doi":"10.1109/ISQED.2006.17","DOIUrl":null,"url":null,"abstract":"In this paper a technique is proposed to estimate the level of difficulty of formally verifying an RTL circuit. The technique is based on extensive experimental data generated from a wide range of industrial and academic benchmarks. Statistical as well as intuitive inferences have been drawn from the data to obtain an algorithm that can classify the level of difficulty of formally verifying a property on a particular circuit into five broad categories. The difficulty of verifying the whole circuit is a weighted average of the difficulty of verifying its individual properties. The level of coverage generated by the properties gives us a confidence level on the accuracy of the metric","PeriodicalId":138839,"journal":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","volume":"189 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-03-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"A technique for estimating the difficulty of a formal verification problem\",\"authors\":\"Indradeep Ghosh, M. Prasad\",\"doi\":\"10.1109/ISQED.2006.17\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper a technique is proposed to estimate the level of difficulty of formally verifying an RTL circuit. The technique is based on extensive experimental data generated from a wide range of industrial and academic benchmarks. Statistical as well as intuitive inferences have been drawn from the data to obtain an algorithm that can classify the level of difficulty of formally verifying a property on a particular circuit into five broad categories. The difficulty of verifying the whole circuit is a weighted average of the difficulty of verifying its individual properties. The level of coverage generated by the properties gives us a confidence level on the accuracy of the metric\",\"PeriodicalId\":138839,\"journal\":{\"name\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"volume\":\"189 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-03-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"7th International Symposium on Quality Electronic Design (ISQED'06)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2006.17\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"7th International Symposium on Quality Electronic Design (ISQED'06)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2006.17","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A technique for estimating the difficulty of a formal verification problem
In this paper a technique is proposed to estimate the level of difficulty of formally verifying an RTL circuit. The technique is based on extensive experimental data generated from a wide range of industrial and academic benchmarks. Statistical as well as intuitive inferences have been drawn from the data to obtain an algorithm that can classify the level of difficulty of formally verifying a property on a particular circuit into five broad categories. The difficulty of verifying the whole circuit is a weighted average of the difficulty of verifying its individual properties. The level of coverage generated by the properties gives us a confidence level on the accuracy of the metric