片上系统的CAD流程

P. Foulon
{"title":"片上系统的CAD流程","authors":"P. Foulon","doi":"10.1109/ICM.2001.997655","DOIUrl":null,"url":null,"abstract":"The introduction of very high deep sub-micron technology introduces a lot of new problems due to the increase in complexity. In order to handle huge chips containing 40-50 millions of transistors gathered in 30-40 blocks (commonly named IPs), multi clock domains, multi powered analog blocks, routed on 6 metal layers with some wire length measuring up to 3 cm, a hierarchical approach must be set up focusing on verification and timing closure. The author considers the following aspects of the problem: timing, data structures, top-down methodology, design teams, RTL quality, logic design standardization, DFT rules, formal proof, system verification, timing block level sign-off, and physical sign-off.","PeriodicalId":360389,"journal":{"name":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"CAD flow for system on chip\",\"authors\":\"P. Foulon\",\"doi\":\"10.1109/ICM.2001.997655\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The introduction of very high deep sub-micron technology introduces a lot of new problems due to the increase in complexity. In order to handle huge chips containing 40-50 millions of transistors gathered in 30-40 blocks (commonly named IPs), multi clock domains, multi powered analog blocks, routed on 6 metal layers with some wire length measuring up to 3 cm, a hierarchical approach must be set up focusing on verification and timing closure. The author considers the following aspects of the problem: timing, data structures, top-down methodology, design teams, RTL quality, logic design standardization, DFT rules, formal proof, system verification, timing block level sign-off, and physical sign-off.\",\"PeriodicalId\":360389,\"journal\":{\"name\":\"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICM.2001.997655\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICM 2001 Proceedings. The 13th International Conference on Microelectronics.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2001.997655","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

极高深亚微米技术的引入,由于复杂性的增加,带来了许多新的问题。为了处理包含40- 5000万个晶体管的巨大芯片,这些晶体管聚集在30-40个块(通常称为ip)、多时钟域、多电源模拟块上,在6个金属层上布线,一些电线长度可达3厘米,必须建立一个分层方法,重点是验证和定时关闭。作者考虑了问题的以下几个方面:时序、数据结构、自顶向下的方法、设计团队、RTL质量、逻辑设计标准化、DFT规则、正式证明、系统验证、时序块级签名和物理签名。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
CAD flow for system on chip
The introduction of very high deep sub-micron technology introduces a lot of new problems due to the increase in complexity. In order to handle huge chips containing 40-50 millions of transistors gathered in 30-40 blocks (commonly named IPs), multi clock domains, multi powered analog blocks, routed on 6 metal layers with some wire length measuring up to 3 cm, a hierarchical approach must be set up focusing on verification and timing closure. The author considers the following aspects of the problem: timing, data structures, top-down methodology, design teams, RTL quality, logic design standardization, DFT rules, formal proof, system verification, timing block level sign-off, and physical sign-off.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信