等温时效后SAC-R的高应变率低温性能

P. Lall, M. Saha, J. Suhling, K. Blecker
{"title":"等温时效后SAC-R的高应变率低温性能","authors":"P. Lall, M. Saha, J. Suhling, K. Blecker","doi":"10.1115/ipack2020-2659","DOIUrl":null,"url":null,"abstract":"\n Electronic parts in military, automotive, avionics and space applications may be subjected to sustained operation at high temperature in addition to high strain-rate loads. Parts may be stored in non-climate-controlled enclosures prior to deployment. Earlier studies on undoped SAC alloys have shown that the material properties evolve after prolonged period of storage at even modest temperatures. In order to mitigate the aging effects, a number of alloy formulation have been proposed. Data of the mechanical properties of lead-free solder alloys which is used for interconnection in the electronic packaging at high strain rates and at high storage temperature is very essential for design optimization of electronic package sustainability at extreme temperature environment because the SAC solders have shown to have degradation in mechanical properties at prolonged exposure to storage temperature. Industries have come up with a solution to reduce the degradation using dopants in SAC solder. In this study, a doped SAC solder called SAC-R has been subjected to high strain rate testing after extended storage at temperature of 50°C for 1 month, 2 months and 3 months. Samples with no aging and aged samples for up to 3-months have been subjected to uniaxial tensile tests to measure the mechanical properties of SAC-R for High and Low operating temperature ranging from −65°C to +200°C. The material data has been used to compute the constants for the Anand Visco-Plasticity model. The ability of the model to represent the material constitutive behavior has been quantified by comparing the model predictions of the uniaxial tensile test with the experimental data.","PeriodicalId":199024,"journal":{"name":"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","volume":"32 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"High Strain Rate Low Temperature Properties for SAC-R After Exposure to Isothermal Aging\",\"authors\":\"P. Lall, M. Saha, J. Suhling, K. Blecker\",\"doi\":\"10.1115/ipack2020-2659\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\\n Electronic parts in military, automotive, avionics and space applications may be subjected to sustained operation at high temperature in addition to high strain-rate loads. Parts may be stored in non-climate-controlled enclosures prior to deployment. Earlier studies on undoped SAC alloys have shown that the material properties evolve after prolonged period of storage at even modest temperatures. In order to mitigate the aging effects, a number of alloy formulation have been proposed. Data of the mechanical properties of lead-free solder alloys which is used for interconnection in the electronic packaging at high strain rates and at high storage temperature is very essential for design optimization of electronic package sustainability at extreme temperature environment because the SAC solders have shown to have degradation in mechanical properties at prolonged exposure to storage temperature. Industries have come up with a solution to reduce the degradation using dopants in SAC solder. In this study, a doped SAC solder called SAC-R has been subjected to high strain rate testing after extended storage at temperature of 50°C for 1 month, 2 months and 3 months. Samples with no aging and aged samples for up to 3-months have been subjected to uniaxial tensile tests to measure the mechanical properties of SAC-R for High and Low operating temperature ranging from −65°C to +200°C. The material data has been used to compute the constants for the Anand Visco-Plasticity model. The ability of the model to represent the material constitutive behavior has been quantified by comparing the model predictions of the uniaxial tensile test with the experimental data.\",\"PeriodicalId\":199024,\"journal\":{\"name\":\"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems\",\"volume\":\"32 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-27\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1115/ipack2020-2659\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ASME 2020 International Technical Conference and Exhibition on Packaging and Integration of Electronic and Photonic Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1115/ipack2020-2659","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

军事,汽车,航空电子和空间应用中的电子部件除了高应变率载荷外,还可能在高温下持续运行。在部署之前,部件可能存储在非气候控制的外壳中。早期对未掺杂SAC合金的研究表明,即使在中等温度下长时间储存,材料性能也会发生变化。为了减轻时效效应,人们提出了许多合金配方。在高应变率和高存储温度下,用于电子封装互连的无铅焊料合金的机械性能数据对于极端温度环境下电子封装可持续性的设计优化非常重要,因为SAC焊料在长时间暴露于存储温度下会出现机械性能退化。工业界已经提出了一种解决方案,以减少在SAC焊料中使用掺杂剂的退化。在本研究中,一种名为SAC- r的掺杂SAC焊料在50°C温度下延长储存1个月、2个月和3个月后,进行了高应变率测试。未老化的样品和老化3个月的样品进行了单轴拉伸试验,以测量SAC-R在- 65°C至+200°C的高、低工作温度下的机械性能。材料数据被用来计算Anand粘塑性模型的常数。通过将单轴拉伸试验的模型预测与实验数据进行比较,量化了模型表征材料本构行为的能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
High Strain Rate Low Temperature Properties for SAC-R After Exposure to Isothermal Aging
Electronic parts in military, automotive, avionics and space applications may be subjected to sustained operation at high temperature in addition to high strain-rate loads. Parts may be stored in non-climate-controlled enclosures prior to deployment. Earlier studies on undoped SAC alloys have shown that the material properties evolve after prolonged period of storage at even modest temperatures. In order to mitigate the aging effects, a number of alloy formulation have been proposed. Data of the mechanical properties of lead-free solder alloys which is used for interconnection in the electronic packaging at high strain rates and at high storage temperature is very essential for design optimization of electronic package sustainability at extreme temperature environment because the SAC solders have shown to have degradation in mechanical properties at prolonged exposure to storage temperature. Industries have come up with a solution to reduce the degradation using dopants in SAC solder. In this study, a doped SAC solder called SAC-R has been subjected to high strain rate testing after extended storage at temperature of 50°C for 1 month, 2 months and 3 months. Samples with no aging and aged samples for up to 3-months have been subjected to uniaxial tensile tests to measure the mechanical properties of SAC-R for High and Low operating temperature ranging from −65°C to +200°C. The material data has been used to compute the constants for the Anand Visco-Plasticity model. The ability of the model to represent the material constitutive behavior has been quantified by comparing the model predictions of the uniaxial tensile test with the experimental data.
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