下填填料沉降对密封剂可靠性性能的影响

L. Fan, Zhuqing Zhang, C. Wong
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引用次数: 15

摘要

倒装芯片技术已经发展了一段时间,下填材料对其发展做出了很大的贡献。聚合物衬底填充物通过填补硅芯片和有机衬底之间的空隙,可以显著提高倒装芯片器件的可靠性,因为它耦合了芯片和衬底之间的焊料互连。下填充材料通常由可聚合/可固化的有机基体组成,如环氧/酸酐体系,通常预填充无机填料,如二氧化硅。在典型的加工温度下,对于密度比有机基体高得多的二氧化硅,填料沉降很可能发生。在底填体中预填充二氧化硅填料会改变底填体材料的整体性能,填料在底填体内部的沉降也会导致材料局部性能完全不同。本文研究了硅预填充对倒装器件可靠性性能和热循环/冲击条件下焊点疲劳寿命的影响,以及填料沉降的潜在后果。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of filler settling of underfill encapsulant on reliability performance
Flip chip technology has been evolving for some time, and underfill material has contributed a lot to its development. By filling the gap between silicon die and organic substrate, the polymeric underfill can dramatically enhance the reliability of the flip-chip device, as it couples the solder interconnection with die and substrate. Underfill materials are normally composed of a polymerizable/curable organic matrix, such as the epoxy/anhydride system, normally pre-filled with inorganic filler, such as silica. Filler settling is very likely to happen for silica of a much higher density than that of the organic matrix at typical processing temperatures. Pre-filling the underfill with silica filler would modify the overall properties of the underfill material, and filler settling within underfill would also result in completely different local material properties. This paper investigates the corresponding effect of silica-pre-filling as well as the potential consequence of filler settling on the reliability performance of the flip chip device and solder joint fatigue life under thermal cycle/shock conditions.
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