交变直流和交流胁迫下NBTI恢复的历史依赖性

2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual Pub Date : 2007-04-01 DOI:10.1109/RELPHY.2007.369572

H. Kufluoglu, C. Prasad, M. Agostinelli

{"title":"交变直流和交流胁迫下NBTI恢复的历史依赖性","authors":"H. Kufluoglu, C. Prasad, M. Agostinelli","doi":"10.1109/RELPHY.2007.369572","DOIUrl":null,"url":null,"abstract":"Fast NBTI recovery experiments performed for alternating DC and AC stress modes show that recovery behavior is strongly influenced by degradation history. Proper modeling of PMOS recovery in circuits as well as projections of product lifetime must comprehend the interaction of DC and AC usage states.","PeriodicalId":433104,"journal":{"name":"2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"History Dependent Recovery of NBTI under Alternating DC and AC Stress\",\"authors\":\"H. Kufluoglu, C. Prasad, M. Agostinelli\",\"doi\":\"10.1109/RELPHY.2007.369572\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Fast NBTI recovery experiments performed for alternating DC and AC stress modes show that recovery behavior is strongly influenced by degradation history. Proper modeling of PMOS recovery in circuits as well as projections of product lifetime must comprehend the interaction of DC and AC usage states.\",\"PeriodicalId\":433104,\"journal\":{\"name\":\"2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual\",\"volume\":\"31 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-04-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/RELPHY.2007.369572\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RELPHY.2007.369572","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

在交变直流和交流应力模式下进行的快速NBTI恢复实验表明，恢复行为受降解历史的强烈影响。电路中PMOS回收的正确建模以及产品寿命的预测必须理解直流和交流使用状态的相互作用。

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History Dependent Recovery of NBTI under Alternating DC and AC Stress

Fast NBTI recovery experiments performed for alternating DC and AC stress modes show that recovery behavior is strongly influenced by degradation history. Proper modeling of PMOS recovery in circuits as well as projections of product lifetime must comprehend the interaction of DC and AC usage states.

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2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual

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