V. Yarmolik, Y. Klimets, A. van de Goor, S. Demidenko
{"title":"RAM诊断测试","authors":"V. Yarmolik, Y. Klimets, A. van de Goor, S. Demidenko","doi":"10.1109/MTDT.1996.782499","DOIUrl":null,"url":null,"abstract":"In this paper the following problems are considered : 1) march test's diagnostic capability estimation, ie. the type of the fault and it's location; 2) advanced march tests with diagnostic ability; 3) a march test with the same fault coverage as test March C and optimal diagnostic ability.","PeriodicalId":228146,"journal":{"name":"IEEE International Workshop on Memory Technology, Design and Testing,","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-08-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"30","resultStr":"{\"title\":\"RAM diagnostic tests\",\"authors\":\"V. Yarmolik, Y. Klimets, A. van de Goor, S. Demidenko\",\"doi\":\"10.1109/MTDT.1996.782499\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper the following problems are considered : 1) march test's diagnostic capability estimation, ie. the type of the fault and it's location; 2) advanced march tests with diagnostic ability; 3) a march test with the same fault coverage as test March C and optimal diagnostic ability.\",\"PeriodicalId\":228146,\"journal\":{\"name\":\"IEEE International Workshop on Memory Technology, Design and Testing,\",\"volume\":\"19 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-08-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"30\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Workshop on Memory Technology, Design and Testing,\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MTDT.1996.782499\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Workshop on Memory Technology, Design and Testing,","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MTDT.1996.782499","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this paper the following problems are considered : 1) march test's diagnostic capability estimation, ie. the type of the fault and it's location; 2) advanced march tests with diagnostic ability; 3) a march test with the same fault coverage as test March C and optimal diagnostic ability.
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