{"title":"特别会议:模拟生产测试","authors":"F. Muradali, J. Rivoir","doi":"10.1109/ATS.2007.56","DOIUrl":null,"url":null,"abstract":"In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Special Session: Analog Production Test\",\"authors\":\"F. Muradali, J. Rivoir\",\"doi\":\"10.1109/ATS.2007.56\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.\",\"PeriodicalId\":289969,\"journal\":{\"name\":\"16th Asian Test Symposium (ATS 2007)\",\"volume\":\"18 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2007-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"16th Asian Test Symposium (ATS 2007)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ATS.2007.56\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.56","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In response to trends and needs in test research and development, the Asian Test Symposium introduces an ongoing crafted effort related to analog testing. Over the next few years, the goal of the Special Sessions on Analog Production Test is to examine and improve production oriented issues related to analog circuits. That is, all the steps and procedures related to the test and release of an analog part or system. Such units may be thumbnail-sized components, ultra-high precision dust sized silicon or board/chip-integrated analog systems.