IDD频谱测试方法在故障分析中的应用

2006 15th Asian Test Symposium Pub Date : 2006-11-20 DOI:10.1109/ATS.2006.19

K. Sakaguchi

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引用次数: 3

摘要

IDDQ信息对于LSI的故障定位非常有用。但是发现引起异常IDDQ的检测载体是非常耗时的。由于IDD频谱测试方法可以很容易地检测到异常电源电流，因此可以在短时间内获得测试向量信息。介绍了该方法的应用，并给出了实验结果

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An Application of IDD Spectrum Testing Method to the Fault Analysis

IDDQ information is very useful to localize faults in a LSI. But it is time consuming to discover test vectors which induce abnormal IDDQ. Since the IDD spectrum testing method can detect abnormal supply current easily, we can acquire the test vector information in a short time by the method. An application of the method is introduced and we show experimental results

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来源期刊

2006 15th Asian Test Symposium

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