Design for testability and test generation for static redundancy system level fault-tolerant circuits

The necessary conditions for designing testable static redundancy system-level fault-tolerant circuits are derived. In addition, algorithms are proposed for the efficient generation of test patterns for fault-tolerant circuits designed to satisfy these testability conditions. The test generation algorithm has been incorporated with an algorithm for the construction of majority voting devices and automated to produce a software package that generates testable fault-tolerant circuits along with test patterns to test the resultant circuit completely. As input, the algorithm requires a testable original circuit, along with an associated set of test patterns and the desired design parameters E, R, and K.<>