{"title":"一系列复杂mcm的测试策略","authors":"A. Flint","doi":"10.1109/TEST.1994.527985","DOIUrl":null,"url":null,"abstract":"The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":"{\"title\":\"Test strategies for a family of complex MCMs\",\"authors\":\"A. Flint\",\"doi\":\"10.1109/TEST.1994.527985\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"11\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527985\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527985","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The development of MCM test practices from chip and board test practices is summarized. The general philosophy behind MCM test strategy selection is given. A family of complex MCMs providing computer system building blocks is described. The design features related to testability and test coverage are detailed. Then, test strategies developed for each MCM are related, with emphasis on the improvements in fault coverage and diagnostic resolution provided by attention to design-for-testability.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
