诊断故障仿真的采样技术

Proceedings of 14th VLSI Test Symposium Pub Date : 1996-04-28 DOI:10.1109/VTEST.1996.510857

S. Chakravarty

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引用次数: 4

摘要

采用诊断故障模拟(DFS)技术确定诊断测试集的质量。我们提出了一种新的近似算法，称为“EC/IC采样”，用于DFS。它对等价类(EC)/不可区分类(IC)集合进行采样。提出了一种隐式采样ec / ic的方法，而不显式枚举ec / ic的集合。实验结果表明，该方法是非常有效的。

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A sampling technique for diagnostic fault simulation

The quality of diagnostic test sets (DTS) are determined using diagnostic fault simulation (DFS). We propose a novel approximation algorithm, called "EC/IC Sampling", for DFS. It samples the set of equivalence classes (EC)/indistinguishable classes (IC). An approach to sample ECs/ICs implicitly, without explicitly enumerating the set of ECs/ICs, is presented. Experimental evaluation of the proposed technique show it to be very effective.

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Proceedings of 14th VLSI Test Symposium

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