L. Tan, C. H. Liew, Akeel Nazakat, Jethro Tan, W. F. Kho
{"title":"确定在分析过程中恢复的设备故障机制的策略","authors":"L. Tan, C. H. Liew, Akeel Nazakat, Jethro Tan, W. F. Kho","doi":"10.1109/IPFA.2016.7564327","DOIUrl":null,"url":null,"abstract":"Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.","PeriodicalId":206237,"journal":{"name":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Strategies to determine failure mechanism of devices that recovered during analysis\",\"authors\":\"L. Tan, C. H. Liew, Akeel Nazakat, Jethro Tan, W. F. Kho\",\"doi\":\"10.1109/IPFA.2016.7564327\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.\",\"PeriodicalId\":206237,\"journal\":{\"name\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-07-18\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IPFA.2016.7564327\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPFA.2016.7564327","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Strategies to determine failure mechanism of devices that recovered during analysis
Occurrences of failure recovery in the course of failure analysis work are not uncommon. Despite this, successful identification of the failure mechanism is still possible in some cases based on available data up to the point of failure recovery, circuit layout knowledge and a combination of a few conventional failure analysis techniques.