什么时候C应该放弃物理测试权限?

David A. Greene
{"title":"什么时候C应该放弃物理测试权限?","authors":"David A. Greene","doi":"10.1109/TEST.1994.527942","DOIUrl":null,"url":null,"abstract":"As conventional board designs continue to decrease in size, the cost of \"test\" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"When does it make C to give up physical test access?\",\"authors\":\"David A. Greene\",\"doi\":\"10.1109/TEST.1994.527942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As conventional board designs continue to decrease in size, the cost of \\\"test\\\" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

随着传统电路板设计尺寸的不断减小,“测试”的成本相对于物理的、钉床式的访问正成比例地上升。本文的目的是提供一个通用的框架,通过该框架,用户可以更定量地分析从传统的表面贴装技术(SMT)板中移除物理测试通道的成本和收益,以进行床钉测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
When does it make C to give up physical test access?
As conventional board designs continue to decrease in size, the cost of "test" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信