{"title":"什么时候C应该放弃物理测试权限?","authors":"David A. Greene","doi":"10.1109/TEST.1994.527942","DOIUrl":null,"url":null,"abstract":"As conventional board designs continue to decrease in size, the cost of \"test\" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.","PeriodicalId":309921,"journal":{"name":"Proceedings., International Test Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"When does it make C to give up physical test access?\",\"authors\":\"David A. Greene\",\"doi\":\"10.1109/TEST.1994.527942\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"As conventional board designs continue to decrease in size, the cost of \\\"test\\\" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.\",\"PeriodicalId\":309921,\"journal\":{\"name\":\"Proceedings., International Test Conference\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings., International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.1994.527942\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings., International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.1994.527942","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
When does it make C to give up physical test access?
As conventional board designs continue to decrease in size, the cost of "test" is rising proportionally relative to physical, bed-of-nails access. The purpose of this paper is to provide a generalized framework by which users can more quantitatively analyze the costs and benefits of removing physical test access from conventional, surface mount technology (SMT) boards for the purpose of bed-of-nails testing.