{"title":"一种用于可靠性数据分析的柔性试验结构评估系统","authors":"M. Mori, Y. Kuriyama, N. Shiono","doi":"10.1109/ICMTS.1993.292921","DOIUrl":null,"url":null,"abstract":"A test structure evaluation system with powerful data processing capability is developed for effective measurement data acquisition and reliability data analysis. Data analysis can be performed quickly with a unified data format customized to reliability data. A unified, flexible system is achieved by networking discrete measuring systems and by generalizing common routines in measurement programs.<<ETX>>","PeriodicalId":123048,"journal":{"name":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A flexible test structure evaluation system for reliability data analysis\",\"authors\":\"M. Mori, Y. Kuriyama, N. Shiono\",\"doi\":\"10.1109/ICMTS.1993.292921\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A test structure evaluation system with powerful data processing capability is developed for effective measurement data acquisition and reliability data analysis. Data analysis can be performed quickly with a unified data format customized to reliability data. A unified, flexible system is achieved by networking discrete measuring systems and by generalizing common routines in measurement programs.<<ETX>>\",\"PeriodicalId\":123048,\"journal\":{\"name\":\"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-03-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICMTS.1993.292921\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ICMTS 93 Proceedings of the 1993 International Conference on Microelectronic Test Structures","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICMTS.1993.292921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A flexible test structure evaluation system for reliability data analysis
A test structure evaluation system with powerful data processing capability is developed for effective measurement data acquisition and reliability data analysis. Data analysis can be performed quickly with a unified data format customized to reliability data. A unified, flexible system is achieved by networking discrete measuring systems and by generalizing common routines in measurement programs.<>