纳米级VLSI互连眼图参数提取

2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems Pub Date : 2012-10-01 DOI:10.1109/EPEPS.2012.6457908

M. Mehri, R. Sarvari, A. Seydolhosseini

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引用次数: 0

摘要

本文研究了电容耦合和电感耦合引起的抖动问题。导线上驱动信号的最大频率受其输入上升时间、下降时间、脉冲宽度和邻近信号的耦合效应的限制。给出了由这些效应引起的确定性抖动时间的解析表达式。估计是基于信号波形分量的最快和最慢逼近。同时，我们提取了眼图的睁眼参数。电感效应对眼开度和抖动时间有显著影响。45nm技术用于估计水平和垂直眼睛的张开和抖动时间。将所提出的公式与一些实例的仿真结果进行了比较，结果吻合较好。

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Eye diagram parameter extraction of nano scale VLSI interconnects

In this paper, jitter due to both capacitive and inductive coupling is studied. Maximum frequency of driving signal on a wire is limited by its input rise time, fall time, pulse width, and the coupling effect from its neighbors. The analytical expressions to estimate the deterministic jitter time due to these effects are presented. The estimation is based on the fastest and slowest approximation of the signal waveform components. Also, we have extracted the eye opening parameters of the eye diagram. The inductance effects significance is shown on eye opening and jitter time. The 45nm technology is used for estimating the horizontal and vertical eye opening and jitter time. The presented formula is compared with the simulations for some cases and it shows good agreements.

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2012 IEEE 21st Conference on Electrical Performance of Electronic Packaging and Systems

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