{"title":"基于柔性nlc NAND闪存的长期存档SSD数据保留时间预测","authors":"Tomonori Takahashi, Senju Yamazaki, K. Takeuchi","doi":"10.1109/IRPS.2016.7574571","DOIUrl":null,"url":null,"abstract":"This paper proposes a new method to predict the data-retention time of long-term archive SSD with flexible-nLC NAND flash. This paper first reports that the conventional prediction overestimates the data lifetime based on the long-term data retention measurement. Then, a more precise prediction is proposed. By using this proposal, the most reliable and lowest cost memory architecture is determined. As a result, over 100-year data-retention is achieved, which is 25-times longer than the conventional TLC NAND flash memory.","PeriodicalId":172129,"journal":{"name":"2016 IEEE International Reliability Physics Symposium (IRPS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":"{\"title\":\"Data-retention time prediction of long-term archive SSD with flexible-nLC NAND flash\",\"authors\":\"Tomonori Takahashi, Senju Yamazaki, K. Takeuchi\",\"doi\":\"10.1109/IRPS.2016.7574571\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes a new method to predict the data-retention time of long-term archive SSD with flexible-nLC NAND flash. This paper first reports that the conventional prediction overestimates the data lifetime based on the long-term data retention measurement. Then, a more precise prediction is proposed. By using this proposal, the most reliable and lowest cost memory architecture is determined. As a result, over 100-year data-retention is achieved, which is 25-times longer than the conventional TLC NAND flash memory.\",\"PeriodicalId\":172129,\"journal\":{\"name\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-04-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"10\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 IEEE International Reliability Physics Symposium (IRPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRPS.2016.7574571\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE International Reliability Physics Symposium (IRPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.2016.7574571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Data-retention time prediction of long-term archive SSD with flexible-nLC NAND flash
This paper proposes a new method to predict the data-retention time of long-term archive SSD with flexible-nLC NAND flash. This paper first reports that the conventional prediction overestimates the data lifetime based on the long-term data retention measurement. Then, a more precise prediction is proposed. By using this proposal, the most reliable and lowest cost memory architecture is determined. As a result, over 100-year data-retention is achieved, which is 25-times longer than the conventional TLC NAND flash memory.
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