晶片附著胶缺陷对LED晶片结温均匀性的影响

Mian Tao, S. Lee, M. Yuen, Guoqi Zhang, W. V. van Driel
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引用次数: 8

摘要

在文献中,发光二极管(LED)的结温被认为在整个芯片上具有均匀分布。这种看法是基于这样一个假设,即贴片胶(DAA)以均匀的厚度覆盖LED芯片的整个底部。然而,在现实中,在芯片安装过程中可能存在DAA不足的情况。结果可能导致结温不均匀,产生热点。因此,有必要研究DAA对LED结处热点产生的影响。在本研究中,LED芯片与不同数量的DAA安装在为大功率LED设计的引线框架上。采用高分辨率红外摄像机对LED芯片表面温度进行测量。为了消除红外发射率的影响,对得到的红外图像进行了仔细的校正。在DAA缺失的交界处观察到热点。详细分析了DAA分布对热点的影响,并讨论了产生这种现象的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Effect of die attach adhesive defects on the junction temperature uniformity of LED chips
In the literature, the junction temperature of a light-emitting diode (LED) has been considered having a uniform distribution over the whole chip. Such a perception is based on the assumption that the die attach adhesive (DAA) covers the whole bottom of the LED chip with a uniform thickness. However, in reality, there may be insufficient DAA during the chip mounting process. As a result, non-uniform junction temperature may be induced and hot spots could occur. Therefore, it is essential to investigate the effect of DAA on the creation of hot spots at the LED junction. In the present study, LED chips were mounted with various amounts of DAA on a leadframe designed for high power LED. A high resolution infra-red (IR) camera was used to measure the temperature on the surface of the LED chip. The obtained IR images were calibrated carefully in order to eliminate the influence from IR emissivity. Hot spots were observed at the junction areas where DAA was missing. Detailed analysis for illustrating the effect of DAA distribution on hot spots is presented and reasons for such a phenomenon are discussed.
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